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DDR内存

TID基础知识 字幕
TID基础知识
课程时长:52:03
视频集数:3
标签: TID 双极结转移 MOSFET
The most common radiation requirement in the aerospace design community is Total Ionizing Dose (TID), also known as total dose. Total dose effects are caused when electrons and protons create excess charge in the dielectric layers used for insulation in electronic devices. Total dose effects are cumulative and require chronic exposure to numerous radiation events before device degradation becomes obvious. Electronics in a satellite or spacecraft thus accumulate TID damage over time as they operate under continuous levels of radiation. While electrons are mobile in insulators, the holes (positively-charged atoms) must move by breaking bonds and can become trapped in defects. The result of this accumulated positive charge in a device’s insulators leads to degradation and/or device failure. The oxide charge buildup affects the current-voltage characteristics of transistors used in semiconductor circuits. Proper operation of a transistor relies on the ability to switch it from a low-conductance (off) state to a high-conductance (on) state as the gate voltage passes through a threshold. Extended exposure to TID radiation can shift the threshold voltages, making transistors easier or harder to switch. Radiation may also increase the leakage current, causing the on and off states of the transistors to become less distinguishable. Either effect can ultimately cause circuit failure. For our space products, these effects have been characterized and summarized in our TID Radiation Reports.
TI空间产品的辐射硬度保证(RHA)工艺 字幕
TI空间产品的辐射硬度保证(RHA)工艺
课程时长:7:23
视频集数:1
标签: RHA工艺 TID
Total Ionizing Dose (TID) variation concerns TI’s Radiation Hardness Assurance (RHA) Process RHA designator in the Standard Microcircuit Drawing (SMD) How to download radiation effects data
电源系统设计工具 字幕
湖北快3 电源系统设计工具
课程时长:6:32
视频集数:1
讲师: 冀玉丕
标签: 电源 PSDS研讨会
电源系统设计工具
新一代通信板上和服务器板上电源工作机理介绍和示例 字幕
新一代通信板上和服务器板上电源工作机理介绍和示例
课程时长:49:22
视频集数:6
讲师:秦小虎
标签: 电源 通信板 服务器板
通信电源趋势和传统控制模式电源的简介;D-CAP自适应导通时间控制; D-CAP自适应导通文波注入电路解析和环路测试方法; D-CAP自适应导通测试数据示例和稳定性优化 ; D-CAP D-CAPII III代表产品型号 ;设计示例。
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